Togano K., Kumakura H., Matsumoto A., Tarantini C., Huang H., Ma Y., Hellstrom E., Kametani F., Su Y.
Larbalestier D.C., Kvitkovic J., Parrell J.A., Hellstrom E.E., Jiang J., Trociewitz U.P., Huang Y., Kametani F., Shen T., Barua S., Hossain S.I., Oloye T.A., Bugaris D.E., Goggin C.
Larbalestier D.C., Hellstrom E.E., Jiang J., Trociewitz U.P., Kametani F., Matras M., Su Y., Hossain S.I., Oloye T.A.
Ключевые слова: Bi2212, wires round, density, texture, grain boundaries, heat treatment, fabrication, PIT process, critical caracteristics, Jc/B curves, transport currents, microstructure
Larbalestier D.C., Grovenor C.R., Tarantini C., Kametani F., Lee P.J., Balachandran S., Su Y., Moody M.P., Heald S.M., Wheatley L.
Larbalestier D.C., Parrell J.A., Hellstrom E.E., Jiang J., Trociewitz U.P., Huang Y., Kametani F., Barua S., Oz Y., Hossain S.I., Cooper J., Miller E., Oloye T.A.
Ключевые слова: HTS, REBCO, coated conductors, critical caracteristics, Jc/B curves, nitrogen liquid , helium liquid, comparison, measurement setup, measurement technique, resistive transition, critical current density, temperature dependence, angular dependence, magnetic field dependence, microstructure, nanodoping, nanorods, nanoscaled effects, size effect, pinning force, experimental results, numerical analysis
Larbalestier D.C., Tarantini C., Kametani F., Lee P.J., Balachandran S., Starch W.L., Su Y., Walker B.
Larbalestier D.C., Miao H., Parrell J.A., Hellstrom E.E., Jiang J., Trociewitz U.P., Huang Y., Sengupta S., Kametani F., Shen T., White M., Hunt A., Brown M.D., Bradford G., Hossain S.I., Cooper J., Miller E., Revur R.
Ключевые слова: HTS, Bi2223, tapes, texture, grain structure, filaments, magnetization curves, grain boundaries, microstructure, electron diffraction, experimental results
Larbalestier D.C., Kim Y., Jiang J., Trociewitz U.P., Hellstrom E., Kametani F., Lu J., Lee P., Miller G., Cooley L., Davis D., Barua S., Martin E., English L., Oz Y., Bosque E.S., Hossain I., Levitan J., Bradford G., Jones J., Juliao A., Gillman J.
Larbalestier D.C., Hellstrom E.E., Jiang J., Trociewitz U.P., Kametani F., Matras M., Francis A., Alicea R.
Larbalestier D.C., Hellstrom E.E., Jiang J., Trociewitz U.P., Kametani F., Matras M., Francis A., Alicea R.
Ключевые слова: HTS, Bi2212, wires round, filaments, geometry effects, critical caracteristics, overpressure processing, fabrication, Jc/B curves
Lee S., Tarantini C., Lee J., Hellstrom E.E., Jiang J., Kametani F., Yoon S., Seo S., Weiss J.D., Oh M.J., Collantes Y., Jo Y.J.
Larbalestier D.C., Coulter J.Y., Polyanskii A., Rossi L., Kametani F., Hu X., Jaroszynski J., Abraimov D., Sinclair J.W., Stangl A.
Ключевые слова: HTS, Bi2212/AgMg, wires round, insulation coating, doping effect, sheath, overpressure processing, fabrication, PIT process, heat treatment, microstructure
Larbalestier D.C., Zhang Y., Selvamanickam V., Polyanskii A., Galstyan E., Xu A., Kametani F., Jaroszynski J., Abraimov D., Griffin V., Majkic G., Yao Y., Gharahcheshmeh M.H.
Bottura L., Larbalestier D.C., Scheuerlein C., Rikel M.O., Hellstrom E.E., Jiang J., Kametani F., Michiel M.D., Ballarino A., Kadar J., Andrieux J., Doerrer C.
Ключевые слова: HTS, Bi2212/Ag, wires, fabrication, melting, phase formation, oxygenation treatments, PIT process, X-ray diffraction
Hahn S., Kim Y., Larbalestier D., Chen P., Jiang J., Hellstrom E., Kametani F., Trociewitz U., Lu J., Griffin V., Hilton D., Starch W., Davis D., Matras M., Francis A., Boebinger M., Bosque E., Constantinescu A., English L., Oz Y.
Ключевые слова: HTS, YBCO, thin films, nanodoping, nanoscaled effects, stacking fault, defects, PLD process, substrate SrTiO3, critical caracteristics, irreversibility fields, microstructure, critical current density, angular dependence, magnetic field dependence, temperature dependence, upper critical fields, Jc/B curves, pinning force
Ключевые слова: HTS, Bi2223, tapes, Bi2212, wires round, comparison, texture, critical caracteristics, Jc/B curves, grain structure, grain boundaries, magnetization, experimental results
Bottura L., Larbalestier D.C., Scheuerlein C., Rikel M.O., Hellstrom E.E., Jiang J., Kametani F., Michiel M.D., Ballarino A., Kadar J., Andrieux J., Doerrer C.
Ключевые слова: HTS, Bi2212/Ag, PIT process, fabrication, densification, melting, porosity, critical caracteristics, critical current density, bubbles
Larbalestier D.C., Scheuerlein C., Chen P., Hellstrom E.E., Jiang J., Trociewitz U.P., Kametani F., Lee P.J., DALBAN-CANASSY M., Matras M., Craig N.C.
Larbalestier D.C., Hellstrom E.E., Jiang J., Trociewitz U.P., Kametani F., Lee P.J., Matras M.R., Craig N.C.
Ключевые слова: HTS, Bi2212/Ag, wires round, fabrication, overpressure processing, critical caracteristics, critical current density, microstructure, length
Ключевые слова: HTS, Bi2212/Ag, wires, densification, critical caracteristics, critical current, critical current density, n-value, experimental results, bubbles
Ferdeghini C., Polyanskii A., Braccini V., Putti M., Palenzona A., Pallecchi I., Bernini C., Kametani F., Romano G., Tropeano M., Martinelli A., Lamura G., Cimberle M.R., Fittipaldi R., Vecchione A., Sala A.
Malagoli A., Larbalestier D.C., Scheuerlein C., Miao H., Parrell J.A., Hellstrom E.E., Jiang J., Huang Y., Kametani F., Michiel M.D., Shen T.
Malagoli A., Larbalestier D.C., Scheuerlein C., Hellstrom E.E., Jiang J., Kametani F., Di Michiel M., Scheel M.
Christen D.K., Larbalestier D.C., Selvamanickam V., Gurevich A., Tarantini C., Chen Y., Kametani F., Zuev Y.L., Jaroszynski J.
Jia Y., Wen H.H., Lee S., Eom C.B., Putti M., Pallecchi I., Bellingeri E., Tropeano M., Ferdeghini C., Palenzona A., Tarantini C., Yamamoto A., Jiang J., Jaroszynski J., Kametani F., Abraimov D., Polyanskii A., DWeiss J., EHellstrom E., Gurevich A., Larbalestier D.C., Jin R., Sales B.C., Sefat S.A., McGuire M.A., Mandrus D., Cheng P.
Chen Z., Larbalestier D.C., Xie Y., Selvamanickam V., Chen Y., Xu A., Kametani F., Jaroszynski J.J., Viouchkov Y.L.
Putti M., Pallecchi I., Bellingeri E., Cimberle M.R., Tropeano M., Ferdeghini C., Palenzona A., Tarantini C., Yamamoto A., Jiang J., Jaroszynski J., Kametani F., Abraimov D., Polyanskii A., Weiss J.D., Hellstrom E.E., Gurevich A., Larbalestier D.C., Jin R., Sales B.C., Sefat A.S., McGuire M.A., Mandrus D., Cheng P., Jia Y., Wen H.H., Lee S., Eom C.B.
Weijers H.W., Larbalestier D.C., Liu X., Hellstrom E.E., Jiang J., Trociewitz U.P., Kametani F., Noyes P., Viouchkov Y., Shen T., Myers D., LoSchiavo M., Schwartz J.L.
Ключевые слова: HTS, Bi2212, wires round, test results, critical caracteristics, critical current, magnetic field dependence, high field magnets
Ключевые слова: HTS, YBCO, films thick, nanodoping, Jc/B curves, pinning force, substrate SrTiO3, PLD process, thickness dependence, microstructure, critical caracteristics, fabrication
Ключевые слова: HTS, REBCO, coated conductors, substrate Hastelloy, mechanical properties, heat treatment, IBAD process, ISD process, YBCO, fabrication, strain effects, experimental results
Osamura K., Nakao-Kametani F.(fumi.nakao@materials.mbox.media.kyoto-u.ac.jp)
Ключевые слова: HTS, Bi2223/Ag, tapes, phase formation, heat treatment, microstructure, fabrication, critical current density, critical caracteristics
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